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Turnkey solution

by selecting the right SEM/FIB

The application defines the instrumentation!

Do you agree?

Are your planned applications somewhere within the following topics:
  • Handling of smallest objects
  • Nanomanipulation and gripping
  • High throughput TEM lamella preparation
  • In-SEM/FIB NanoFabrication


  • Quantitative traceable 3-dimensional in-SEM/FIB surface analysis
  • Material Research
  • Forensic Research
  • Tribology


  • AFM-STM in-SEM applications
  • Mask Repair
  • Wafer Probing


  • Similar tasks?

Then it may be helpful to collect all information available about how to solve the planned application in the most convenient way. This leads to the right handling, manipulation and measurement tools - and to a fitting SEM, FIB or Dual beam chamber. Klocke Nanotechnik can help you during this important decision phase, e.g. with a SEM selection guide, available on request.

Or you can order one of the SEM turnkey solutions described on the right.

 

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