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Nanorobotics for SEM, FIB, TEM

Extend a Microscope to a Material Processing System

The SEM/FIB Workbench:

Our Nanorobotics extend Electron or Ion Microscopes from analytical instruments to material processing systems. This page is the entry to a group of complete systems.

All applications base on our absolute positioning high performance Nanorobotics manipulators. Once installed in a SEM or FIB they can be expanded by several different modules to form application oriented turnkey solutions. This modular design allows the usage of one basic investment for several different applications.

Plenty of further descriptions are available on request, please contact us.

 

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